The Graphics Editor LAYED

LAYED was especially developed for electronic layout design, but can also be used as a multi-purpose vector graphics tool. It is a powerful multi-window all-angle IC layout editor. With the extensive LAYED command set, the drawing of IC layouts is easy and quickly mastered, even in the case of very complex structures. These commands are available in pull-down menus, through optional icons (the tool box) and under short-cut keys. Direct entry of the commands via the keyboard is supported as well.

Program Components and Features:

• LAYED can create and edit hierarchical layout data consisting of rectangles, polygons, lines, paths (wires), tracks of convex polygons, circles, text strings and structure calls (with any scale and rotation) in at most 256 layers. GDSII datatypes are supported. Structures (also "groups" or "cells") are read from a work library and up to 19 reference libraries. The group lock/unlock feature allows multi-user work. The editor supports edit-in-place in up to 16 layout windows and displays layers in user-definable priority levels. Commands may be nested up to five levels, which guarantees their flexible use.
      TOP

• LAYED executes Online DRC for a restricted set of design rules. So a lot of frequent errors may be detected immediately while editing a layout.
      TOP

• LAYVIEW is a low-cost program version derived from LAYED. LAYVIEW can be used to display graphical layout data in DBX, GDS2, OASIS, CIF, DXF, and GERBER(RS-274X) format.
      TOP

• LAYED / LAYVIEW is also a graphical evaluation tool for the layout verification system LAYVER. It can display the LAYVER layers as well as its DRC and LVS results, separately or superimposed on the (hierarchical) layout. DRC errors can be corrected and subsequently deleted. Labels can be created for LVS comparison. All this provides the user with a convenient interface for the graphical post-processing of LAYVER's DRC, LVS and parameter extraction results.
      TOP

• LAYED / LAYVIEW provides a schematic-layout cross-probing interface using either the schematic editors LAYCIR, SPE, Simetrix or the display of MICROSIM schematics in a separate LAYED subwindow. This enables the user to cross-probe schematics and LAYVER LVS verification results in one environment. Text listing of unmatched devices is no longer needed.
      TOP

• LAYED has commands for object and single vertex selection. The snap type, the line length and the maximum number of vertices are supervised, while creating and editing objects.

• LAYED supports arbitrary cuts and merges in addition to any angle rotation of any (number of) selected objects or group calls.

• LAYED includes many special functions for the modification of selected objects. They were trimmed to meet the requirements of a layout design, e.g. commands to merge and cut polygons, transform circles and paths to polygons, and move sides. Also, the creation and resolving of hierarchies with simultaneous magnification, is supported.
      TOP

• LAYED supports the execution of command files containing LAYED command  procedures. These files are text files and can be used to initialize the editor, or to store extensive command sequences. Moreover, the journal file used for recording all user input is also written in command file syntax. The procedure interpreter enables the use of variables, arithmetic and logical expressions, standard arithmetic functions, subprocedures and commands for the control of procedure flow.

• LAYED can be initialized by a (command) file to set technology-dependent parameters, layers and layer aliases, and read the design data for editing.
     TOP

• LAYED versions 3.2 and higher support variable (parametric) groups (pGroups or pCells), described by a command sequence and a set of parameters. The pGroups are variable structures  with a layout depending on the current parameter set. The parameters of pGroup instances may be changed at any time immediately resulting in a new layout.
     TOP

• LAYED versions 4.1 and higher: The SDLE/NDLE mode (Schematic/Netlist Driven Layout Editor) allows to control the physical layout design both by a netlist or by a schematic opened in the schematic editor SPE.
     TOP

• The SIMetrix-LAYED Interface (SLI) of LAYED provides the following capabilities:

  • Schematic Driven Layout Editor (SDLE)

  • Schematic-Layout Crossprobing

  • Crossprobing between schematic and devices/nets extracted by LAYVER

  thereby using the schematic editor of the SIMetrix program package.
    TOP

BACK

Copyright (C) TexEDA Design GmbH