SPE/LAYCIR (Schematic & Probing Environment)
SPE is a schematic capture package developed for entering
the schematics of integrated electronic circuits.
LAYCIR is
a new version
of SPE used
in LAYFRAME, moreover
new interfaces support the Simulation with SIMetrix, Smash, and ADS
Features:
SPE creates and processes schematic graphical data in a hierarchical structured form
SPE is unlimited to the number of hierarchical level for a schematic
Free navigation in hierarchy from the schematic view is possible
SPE supports the following data elements: symbols, schematic elements, attributes, text, buses, bus taps, pins, and wires (nets)
Free customization of symbols is possible, both primitive devices (such as transistors, resistors, and gates) and complex sub-circuits referred to as "block" symbols
SPE uses attributes to describe the characteristics or properties of symbols and pins
SPE supports the establishment of reference directories for symbol files
Flexible naming of instances, nets, and buses is possible
SPE uses an open ASCII format for schematic files so that data can be converted to and from a number of standard formats
The SPE-Netlister generates netlists that may be used directly for simulation (for example, using PSpice or HSpice), for automatic layout generation (using Place & Route such as LAYPAR from TexEDA Design GmbH), or for layout verification (for example, using LAYVER also from TexEDA)
Template-driven netlist generation available
Cross-probing can be carried out together with tool LAYED (for LAYVER evaluation or layout editing in SDLE-mode)
SPE checks the schematic consistency (connectivity checking)
Callback parameter calculation using LAYED pGroup procedures
Back annotation for simulation results is possible (SMASH results)
The SPE input file may be an ECS-Synario ASCII file
The SPE-SIMetrix Interface (SLI) provides the following capabilities:
Choosing analysis from SPE
Creating a SIMetrix compatible netlist (SPICE format) from a SPE schematic
Starting the simulation from SPE
Post-probing of node voltages and device port currents from SPE
Copyright (C) TexEDA Design GmbH